Description
Motic Scientific’s PA80MET and PA120MET series microscopes feature a flexible, modular design that can be suited to your specific industrial inspection application. Our PA80MET and PA120MET series microscopes are widely used for FPD, LCD, and silicon wafer inspection.
PA80MET Specification Details
| Optical system | Colour Corrected Infinity Optical System (CCIS®) |
| Illumination | Reflected |
| Binocular Observation Tube (Optional) | Erect type (F.N 25), 20° inclined |
| Trinocular Observation Tube | Erect type (F.N 25), 20° inclined, Trino Light path selection: 2-step (100:0 / 0:100) |
| Eyepiece(s) | 10X (F.N 25), Diopter adjustable, Reticle optional |
| Revolving Nosepiece | 5-position Nosepiece for Brightfield objective lens with DIC slot |
| Base unit – Focus | Stroke range: 29.5 mm / Coarse and Fine focusing knob. Coarse: 17.7 mm/revolution / Fine: 0.1 mm/revolution (1μm scale) Upper limit stopper, Torque adjustment ring |
| Base unit – Electronics | Integrated power supply for light adjustment / LED voltage indicator / IL switch and ECO switch |
| Reflected Illumination | Kohler illumination system / Brightfield, Reflected DIC, simple Polarization |
| Light source | 12V/100W halogen |
| Objectives | |
| Plan S-APO | Plan S-APO 5X/0.15 Plan S-APO 10X/0.3 Plan S-APO 20X/0.45 Plan S-APO 50X/0.8 Plan S-APO 100X/0.9 (Optional) |
| LPlan S-APO | LPlan S-APO 20X/0.4 LPlan S-APO 50X/0.55 LPlan S-APO 100X/0.8 |
| Stage | |
| Size | 325 (Max width 415) x 325mm |
| Moving stroke X&Y | 200 x 200mm |
| Optional Stage | wafer stage |
