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Description
Panthera TEC MAT
Industrial Metallurgical Microscope:
Powerful solutions for material sciences
The Panthera TEC series of Industrial microscopes is the missing link in the Panthera family: Incident light microscopes for material sciences, ready to handle semiconductors, LCD panels and wafers with a clever Brightfield/Darkfield illumination concept. To extend the application fields for compound materials, microscope models with additional Transmitted light by integrated LED illumination can be chosen.
Robust Functionality for Industrial Applications:
The Panthera TEC models offer a high value for the inspection of semiconductors
and compound materials especially in technical education and quality control of
industry. Brightfield, Darkfield and simple Polarization contrast are combined with
a new segmental illumination. This concept allows an oblique incident illumination,
perfect for the detection of scratches or other defects on flat and reflecting surfaces
without a need to move the sample.
The Panthera TEC BD models feature LD Plan BD objectives with a superb
imaging performance, mounted on a 5-fold encoded nosepiece. The light intensity
for each objective position is automatically memorized and will be repeated once
the objective is swung in again.
The Panthera TEC is clearly focused on material sciences. Incident illumination is
performed by a 3W LED of selectable color temperature. The incident/transmitted
stand type additionally carries a transmitted LED illumination system with 39
LEDs mounted in an LED condenser. For compound materials, a simultaneous
illumination is possible. Here, a stage with glass insert will be applied. 2 stage
options (3×2”, 6×4”) give flexibility for different sample dimensions.
The Panthera TEC models fill the last gap in the Panthera family. Now also
opaque industrial samples can be examined with an extended ease of use: brilliant optics for significant image results, flexible models for a variety of applications and smart functionality in microscope controls.
